International Journal on Advanced Science, Engineering and Information Technology, Vol. 9 (2019) No. 2, List of accepted papers, DOI:10.18517/ijaseit.9.2.8281

A Feature Extractor IC for Acoustic Emission Non-destructive Testing

Daniele Giardino, Marco Matta, Sergio Spanò

Abstract

In this paper, we present the Application Specific Integrated Circuit (ASIC) implementation of a Digital Signal Processing (DSP) circuit for an Acoustic Emission (AE) non-destructive testing. The proposed circuit has been designed forIoT (Internet of Things) applications and it can be used to simplify the existing procedures adopted for structural integrity verifications of pressurized metal tanks. The DSP circuit has been coded in VHDL and synthesized in 90 nm technology using Synopsys. The circuit has been characterized in terms of area, speed and power consumption. Experimental results show that the proposed circuit presents  very low power consumption properties and low area requirements.

Keywords:

IoT; Acoustic Emission; Non-destructive testing; DSP; ASIC.

Viewed: 23 times (since Sept 4, 2017)

cite this paper